Program Committee

• [PC Chair] Benoit Baudry, INRIA-Bretagne Atlantique, France
  
• [PC Chair] Alessandro Orso, Georgia Institute of Technology, USA 

• Paul Ammann, George Mason University, USA
• James Andrews, University of Western Ontario,  Canada
• Giuliano Antoniol, Ecole Polytechnique de Montreal, Canada
• Paul Baker, Visa, UK
• Thomas Ball, Microsoft Research, USA
• Cristiano Bertolini, United Nations University, China
• Antonia Bertolino, ISTI-CNR (the Italian National Research Council), Italy
• Kirill Bogdanov, The University of Sheffield, UK
• Fabrice Bouquet, University of Franche-Comte, France
• Renee Bryce, Utah State University, USA
• Tevfik Bultan, University of California Santa Barbara, USA
• Cristian Cadar, Imperial College London, UK
• Jeffrey Carver, University of Alabama, USA
• Byoungju Choi, Ewha Womans University, Korea
• James Clause, University of Delaware, USA
• Myra Cohen, University of Nebraska-Lincoln, USA
• Christoph Csallner, University of Texas at Arlington, USA
• Massimiliano Di Penta, RCOST - University of Sannio, Italy
• Lydie Du Bousquet, Joseph Fourier University, France
• Sigrid Eldh, Ericsson / Karlstad University, Sweden
• Franck Fleurey, SINTEF, Norway
• Phyllis Frankl, Polytechnic Institute of New York University, USA
• Gordon Fraser, University of Sheffield, UK
• Sudipto Ghosh, Colorado State University, USA
• Arnaud Gotlieb, INRIA, France
• Mark Grechanik, University of Illinois at Chicago, USA
• William G.J. Halfond, University of Southern California, USA
• Mark Harman, University College London, UK
• Mary Jean Harrold, Georgia Institute of Technology, USA
• Toru Hasegawa, KDDI R&D Laboratories,  Inc.,Japan
• Natalia Juristo, Universidad Politecnica de Madrid, Spain
• Gail Kaiser, Columbia University, USA
• Aditya Kanade, Indian Institute of Science, India
• Gregory Kapfhammer, Allegheny College, USA
• Sarfraz Khurshid, University of Texas at Austin, USA
• Johannes Kinder, Ecole Polytechnique Federale de Lausanne, Switzerland
• Pieter Kritzinger, University of Cape Town, South Africa
• Bruno Legeard, Smartesting, France
• Yu Lei, University of Texas at Arlington, USA
• José Carlos Maldonado, ICMC-USP, Brasil
• Leonardo Mariani, Universita' di Milano Bicocca, Italy
• Wes Masri, American University of Beirut, Lebanon
• Phil Mcminn, University of Sheffield, UK
• Ali Mesbah, University of British Columbia, Canada
• Tejeddine Mouelhi, University of Luxembourg, Luxembourg
• Henry Muccini, University of L'Aquila, Italy
• Nachiappan Nagappan, Microsoft Research, USA
• Brian Nielsen, Aalborg University, Denmark
• Manuel Nunez, UCM, Spain
• Jeff Offutt, George Mason University, USA
• Mauro Pezzé, University of Lugano, Switzerland
• Lori Pollock, University of Delaware, USA
• Alexander Pretschner, Karlsruhe Institute of Technology (KIT), Germany
• Brian Robinson, ABB Inc. - US Corporate Research, USA
• Abhik Roychoudhury, National University of Singapore, Singapore
• Antonino Sabetta, SAP Research Sophia-Antipolis, France
• Max Schaefer, IBM Research, USA
• Saurabh Sinha, IBM Research - India, India
• Paul Strooper, University of Queensland, Australia
• Lin Tan, University of Waterloo, Canada
• Nikolai Tillmann, Microsoft Research, USA
• Paolo Tonella, Fondazione Bruno Kessler, Italy
• Andreas Ulrich, Siemens AG, Germany
• Willem Visser, Stellenbosch University, South Africa
• Tanja Vos, Universidad Politecnica de Valencia, Spain
• Stephan Weissleder, Fraunhofer Institute, Germany
• Michael Whalen, University of Minnesota, USA
• Laurie Williams, North Carolina State University, USA
• Andreas Windisch, Technische Universitat Berlin, Germany
• Claes Wohlin, Blekinge Institute of Technology, Sweden
• Ji Wu, Beihang University, China
• Michal Young, University of Oregon, USA
• Andreas Zeller, Saarland University, Germany
• Xiangyu Zhang, Purdue University, USA